• RecordNumber
    14596
  • LC Class
    TK
  • LC Number
    7874
  • LC CutterNumber
    .I474
  • LC Date
    1994
  • Author

    International Test Conference (25th: 1994)

  • Title

    International test Conference, 1994 :

  • Author Statement
    The Institute of Electrical and Electronics Engineering
  • Publication
    The Conference
  • Publication Year
    1994
  • Collation
    xii, 1033 p.: illus.; 30 cm
  • Subject

    Integrated circuits -- Testing -- Congresses,Automatic checkout equipment -- Congresses

  • Holding Info.
    0780321030
  • DocumentNumber
    38944
  • SubTitle
    proceedings
  • Index
    Includes index
  • BL
    BL
    • Link To Document
    https://library.iut.ac.ir/dl/search/default.aspx?Term=14596&Field=0&DTC=100