Author :
International Test Conference (25th: 1994)
Title :
International test Conference, 1994 :
Author Statement :
The Institute of Electrical and Electronics Engineering
Publication :
The Conference
Collation :
xii, 1033 p.: illus.; 30 cm
Subject :
Integrated circuits -- Testing -- Congresses,Automatic checkout equipment -- Congresses
Holding Info. :
0780321030
