Neural models and algorithms for digital testing

RecordNumber :

19847

LC Class :

LC Number :

7868

LC CutterNumber :

.L6,C44

Dewey Class :

621

Dewey Number :

.39

Dewey Date :

Author :

Chakradhar, Srimat T

Title :

Neural models and algorithms for digital testing

Author Statement :

by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell

Publication :

Kluwer Academic Publishers

Publication Year :

c1991

Collation :

xii, 184 p.: ill.; 25 cm

Series :

The Kluwer international series in engineering and computer science ; SECS 140. VLSI, computer architecture, and digital signal processing

Subject :

Logic circuits- Testing,Automatic checkout equipment,Digital integrated circuits- Testing- Data processing

ADDED ENTRIES :

Agrawal, Vishwani D., 1943-,Bushnell, Michael L. (Michael Lee), 1950-,Series:Kluwer international series in engineering and computer science ; SECS 140

Holding Info. :

0792391659

DocumentNumber :

32558

Biblography :

Includes bibliographical references and index

BL :

Link To Document :

https://library.iut.ac.ir/dL/search/default.aspx?Term=19847&Field=0&DTC=100