RecordNumber

30673

LC Class

TK

LC Number

7874

LC CutterNumber

.V5666

LC Date

1986

Dewey Class

621

Dewey Date

.395

Title

VLSI testing

Author Statement

edited by T.W. Williams

Publication

North-Holland

Publication Year

1986

Collation

ix, 275 p.: ill.; 25 cm

Series

Advances in CAD for VLSI ; v. 5

Subject

Integrated circuits- Very large scale integration- Testing

ADDED ENTRIES

Williams, T. W., 1943-

Holding Info.

0444878955

DocumentNumber

32476

Biblography

Includes bibliographies

BL

BL