• RecordNumber
    32939
  • LC Class
    TK
  • LC Number
    7871
  • LC CutterNumber
    .M52
  • LC Date
    1993
  • Title

    Microelectronic failure analysis

  • Author Statement
    Thomas W. Lee, editor, Seshu V. Pabbisetty, editor
  • Edition
    3rd ed
  • Publication
    ASM International
  • Publication Year
    c1993
  • Collation
    xv, 409 p.: illus.; 27 cm
  • Subject

    Electronics- Materials- Testing- Handbooks, manuals, etc,Microelectronics- Materials- Testing- Handbooks, manuals, etc

  • ADDED ENTRIES
    Lee, Thomas W
  • Holding Info.
    087170479
  • Original By
    77/10
  • DocumentNumber
    44940
  • SubTitle
    : desk reference
  • Index
    Includes index
  • BL
    BL
    • Link To Document
    https://library.iut.ac.ir/dl/search/default.aspx?Term=32939&Field=0&DTC=100