LC CutterNumber :
.M4,I334
Author :
IEEE International Workshop on Memory Technology, Design, and Testing (1997 : San Jose, Calif.)
Author Statement :
edited by F. Lombardi, R. Rajsuman, and T. Wik
Publication :
IEEE Computer Society Press
Collation :
ix, 103 p.:ill.;28 cm
Notes :
"August 11-12, 1997, San Jose, California"
Subject :
Semiconductor storage devices- Testing- Congresse,Random access memory- Congresses
ADDED ENTRIES :
Lombardi, Fabrizio,1955-
Holding Info. :
0818680997
SubTitle :
: International Workshop on Memory Technology, Design, and Testing
Biblography :
Includes bibliographical references and index
