RecordNumber
:
39546
LC Class
:
QC
LC Number
:
611.6
LC CutterNumber
:
.D4,B43
LC Date
:
1998
Dewey Class
:
621
Dewey Number
:
.381
Dewey Date
:
/52
Title
:
Beam injection assessment of defects in semiconductors
Author Statement
:
editors: M. Kittler...[et al.]
Publication
:
Scitec Pub.
Publication Year
:
1998
Collation
:
xiv, 537 p.:ill.;26 cm
Subject
:
Semiconductors- Defects- Congresses
ADDED ENTRIES
:
Kittler, M
Holding Info.
:
090845039
Original By
:
80/05
DocumentNumber
:
49629
SubTitle
:
: proceedings of the 5th Workshop on ...(BIADS 98), held in Parkhotel Schloss Wulkow near Berlin, Germany, August 30- September 3, 1998
Biblography
:
Includes bibliographical references and index
BL
:
BL
Link To Document :
https://library.iut.ac.ir/dL/search/default.aspx?Term=39546&Field=0&DTC=100
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