RecordNumber :
39546
LC Class :
QC
LC Number :
611.6
LC CutterNumber :
.D4,B43
LC Date :
1998
Dewey Class :
621
Dewey Number :
.381
Dewey Date :
/52
Title :

Beam injection assessment of defects in semiconductors

Author Statement :
editors: M. Kittler...[et al.]
Publication :
Scitec Pub.
Publication Year :
1998
Collation :
xiv, 537 p.:ill.;26 cm
Subject :
Semiconductors- Defects- Congresses
ADDED ENTRIES :
Kittler, M
Holding Info. :
090845039
Original By :
80/05
DocumentNumber :
49629
SubTitle :
: proceedings of the 5th Workshop on ...(BIADS 98), held in Parkhotel Schloss Wulkow near Berlin, Germany, August 30- September 3, 1998
Biblography :
Includes bibliographical references and index
BL :
BL
Link To Document :

بازگشت