• RecordNumber
    40039
  • LC Class
    TK
  • LC Number
    7871.852
  • LC CutterNumber
    .C47
  • Dewey Class
    621
  • Dewey Number
    .3815
  • Dewey Date
    /2
  • Author

    Chim, Wai Kin

  • Title

    Semiconductor device and failue analysis

  • Author Statement
    Wai Kin Chim
  • Publication
    Wiley
  • Publication Year
    2000
  • Collation
    xv, 269 p.:ill.;24 cm
  • Subject

    Semiconductors- Failures,Semiconductors- Testing,Semiconductors- Microscopy,Photon emission

  • Holding Info.
    047149240
  • Original By
    80/08
  • DocumentNumber
    49973
  • SubTitle
    : using photon emission microscopy
  • Biblography
    Includes bibliographical references and index
  • BL
    BL
    • Link To Document
    https://library.iut.ac.ir/dl/search/default.aspx?Term=40039&Field=0&DTC=100