• RecordNumber
    40511
  • LC Class
    QC
  • LC Number
    611.6
  • LC CutterNumber
    .D4,I54
  • LC Date
    2000
  • Title

    2000 IEEE International Workshop on Defect Based Testing

  • Author Statement
    sponsored by IEEE Computer Society Test Technology Technical Committee ; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon
  • Publication
    IEEE Computer Society
  • Publication Year
    c2000
  • Collation
    82 p.: ill.; 28 cm
  • Subject

    Semiconductors- Defects- Congresses

  • ADDED ENTRIES
    Malaiya, Yashwant K
  • Holding Info.
    0769506372
  • Original By
    80/11
  • DocumentNumber
    50399
  • SubTitle
    : proceedings April 30, 2000, Montreal, Canada
  • Index
    Includes index
  • BL
    BL
    • Link To Document
    https://library.iut.ac.ir/dl/search/default.aspx?Term=40511&Field=0&DTC=100