LC CutterNumber :
.D4,I54
Title :
2000 IEEE International Workshop on Defect Based Testing
Author Statement :
sponsored by IEEE Computer Society Test Technology Technical Committee ; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon
Publication :
IEEE Computer Society
Collation :
82 p.: ill.; 28 cm
Subject :
Semiconductors- Defects- Congresses
ADDED ENTRIES :
Malaiya, Yashwant K
Holding Info. :
0769506372
SubTitle :
: proceedings April 30, 2000, Montreal, Canada
