LC CutterNumber :
.M4,I334
Author :
IEEE International Workshop on Memory Technology, Design and Testing (12th :2004 :San Jose, Calif.)
Author Statement :
edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council ... and others
Publication :
IEEE Computer Society
Collation :
vii, 121 p. ill. 27 cm.
Subject :
Semiconductor storage devices- Testing- Congresses,Random access memory- Congresses
ADDED ENTRIES :
Rajsuman, Rochit
SubTitle :
records of the 2004 International Workshop on ..., 9-10 August, 2004, San Jose, California, USA
Biblography :
Includes bibliographical references and author index
