Title :
Test and diagnosis of analogue, mixed-signal and RF integrated circuits
Author Statement :
edited by Yichuang Sun
Publication :
London Institution of Engineering and Technology
Collation :
xx, 389 p.: ill.
Series :
IET circuits, devices and systems series 19
Subject :
Linear integrated circuits -- Testing , Mixed signal circuits -- Testing , Radio frequency integrated circuits -- Testing
ADDED ENTRIES :
AU Sun, Yichuang
وارد كنندة اطلاعات :
aghaee
تاريخ ورود اطلاعات :
1392/06/10
SubTitle :
the system on chip approach
Index :
Includes bibliographical references and index
