RecordNumber
:
51006
LC Class
:
TK
LC Number
:
7874
LC CutterNumber
:
.T76
LC Date
:
1988
Author
:
Tsui, Frank F
Title
:
LSI/VLSI testability design
Author Statement
:
Frank F. Tsui
Publication
:
New York McGraw-Hill
Publication Year
:
1988
Collation
:
xv, 702 p. : ill. ; 24 cm
Subject
:
Integrated circuits -- Large scale integration -- Testing , Integrated circuits -- Very large scale integration -- Testing
ADDED ENTRIES
:
AU Tsui, Frank F , TI
وارد كنندة اطلاعات
:
aghaee
تاريخ ورود اطلاعات
:
1392/08/13
Index
:
Includes bibliographical references and index
Link To Document :
https://library.iut.ac.ir/dL/search/default.aspx?Term=51006&Field=0&DTC=100
All Rights Reserved To Payam Mashregh Company
