RecordNumber
51006
LC Class
TK
LC Number
7874
LC CutterNumber
.T76
LC Date
1988
Author
Tsui, Frank F
Title
LSI/VLSI testability design
Author Statement
Frank F. Tsui
Publication
New York McGraw-Hill
Publication Year
1988
Collation
xv, 702 p. : ill. ; 24 cm
Subject
Integrated circuits -- Large scale integration -- Testing , Integrated circuits -- Very large scale integration -- Testing
ADDED ENTRIES
AU Tsui, Frank F , TI
وارد كنندة اطلاعات
aghaee
تاريخ ورود اطلاعات
1392/08/13
Index
Includes bibliographical references and index