• RecordNumber
    7278
  • LC Class
    TK
  • LC Number
    7874
  • LC CutterNumber
    .A23
  • Dewey Class
    621
  • Dewey Number
    .381
  • Dewey Date
    /5
  • Author

    Abramovici, Miron

  • Title

    Digital systems testing and testable design

  • Author Statement
    Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
  • Publication
    Computer Science Press
  • Publication Year
    c1990
  • Collation
    xxi, 653 p.: ill.; 25 cm
  • Series
    Electrical engineering, communications, and signal processing
  • Subject

    Digital integrated circuits- Testing,Digital integrated circuits- Design and construction

  • Holding Info.
    0716781794
  • DocumentNumber
    38250
  • Biblography
    Includes bibliographical references (p. 644-645) and index
  • BL
    BL
    • Link To Document
    https://library.iut.ac.ir/dl/search/default.aspx?Term=7278&Field=0&DTC=100