Author :
Abramovici, Miron
Title :
Digital systems testing and testable design
Author Statement :
Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
Publication :
Computer Science Press
Collation :
xxi, 653 p.: ill.; 25 cm
Series :
Electrical engineering, communications, and signal processing
Subject :
Digital integrated circuits- Testing,Digital integrated circuits- Design and construction
Holding Info. :
0716781794
Biblography :
Includes bibliographical references (p. 644-645) and index
