LC CutterNumber :
.E4,M87
Author :
Murr, Lawrence E.
Title :
Electron and ion microscopy and microanalysis
Author Statement :
Lawrence E. Murr
Publication :
Marcel Dekker
Collation :
xiv, 793 p.: ill.; 27 cm
Series :
Optical engineering ; v. 1
Subject :
Electron microscopy,Field ion microscopy,Microprobe analysis
ADDED ENTRIES :
Series:Optical engineering (Marcel Dekker, Inc.) ; v. 1
Holding Info. :
0824715535
SubTitle :
: principles and applications
Biblography :
Includes bibliographical references and indexes
