• Volume
    37
  • Year
    1997
  • Page
    923-927
  • Source
    Microelectron. Reliab
  • Format Published
    pdf
  • Abstract
    An attempt has been made in this paper to estimate the reliability of an s-out-of-k system with non-identical component strengths when component strengths follow an exponential distribution. A further assumption is made that all the components are subjected to a common random stress which also follow an exponential distribution. Bayes and maximum likelihood estimators of such system reliability are considered. A Bayes estimate is obtained by using Lindleyʹs approximation. Comparisons are made on the basis of efficiency and Pitman nearness probability through a Monte-Carlo study. © 1997 Elsevier Science Ltd. All rights reserved.
  • Call. No.
    EA 10
  • IndexDate
    1397/09/28
  • Indexer
    dashagha
  • Title of Article

    ESTIMATION OF RELIABILITY OF STRESS-STRENGTH MODEL WITH NON-IDENTICAL COMPONENT STRENGTHS

  • RecordNumber
    11
  • Issue/Number
    6
  • Author/Authors

    RAN JAN KUMAR PAUL , MD. BORHAN UDDIN