• RecordNumber
    19847
  • LC Class
    TK
  • LC Number
    7868
  • LC CutterNumber
    .L6,C44
  • Dewey Class
    621
  • Dewey Number
    .39
  • Dewey Date
    /5
  • Author

    Chakradhar, Srimat T

  • Title

    Neural models and algorithms for digital testing

  • Author Statement
    by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell
  • Publication
    Kluwer Academic Publishers
  • Publication Year
    c1991
  • Collation
    xii, 184 p.: ill.; 25 cm
  • Series
    The Kluwer international series in engineering and computer science ; SECS 140. VLSI, computer architecture, and digital signal processing
  • Subject

    Logic circuits- Testing,Automatic checkout equipment,Digital integrated circuits- Testing- Data processing

  • ADDED ENTRIES
    Agrawal, Vishwani D., 1943-,Bushnell, Michael L. (Michael Lee), 1950-,Series:Kluwer international series in engineering and computer science ; SECS 140
  • Holding Info.
    0792391659
  • DocumentNumber
    32558
  • Biblography
    Includes bibliographical references and index
  • BL
    BL
    • Link To Document
    https://library.iut.ac.ir/dl/search/default.aspx?Term=19847&Field=0&DTC=100