RecordNumber
:
30673
LC Class
:
TK
LC Number
:
7874
LC CutterNumber
:
.V5666
LC Date
:
1986
Dewey Class
:
621
Dewey Date
:
.395
Title
:
VLSI testing
Author Statement
:
edited by T.W. Williams
Publication
:
North-Holland
Publication Year
:
1986
Collation
:
ix, 275 p.: ill.; 25 cm
Series
:
Advances in CAD for VLSI ; v. 5
Subject
:
Integrated circuits- Very large scale integration- Testing
ADDED ENTRIES
:
Williams, T. W., 1943-
Holding Info.
:
0444878955
DocumentNumber
:
32476
Biblography
:
Includes bibliographies
BL
:
BL
Link To Document :
https://library.iut.ac.ir/dL/search/default.aspx?Term=30673&Field=0&DTC=100
All Rights Reserved To Payam Mashregh Company
