Title :
Manufacturing yield evaluation of VLSI/WSI system
Author Statement :
[Bruno Ciciani]
Publication :
IEEE Computer Society Press
Collation :
ix, 435 p.: illus.; 25 cm
Subject :
Integrated Circuits -- Design and construction -- Data processing,Integrated Circuits -- Very large scale integration
ADDED ENTRIES :
Ciciani, Bruno
Holding Info. :
0818662921
Biblography :
Includes bibliographical references
