• RecordNumber
    31943
  • LC Class
    TK
  • LC Number
    7874
  • LC CutterNumber
    .H87
  • Author

    Hurst, Stanley L

  • Title

    VLSI testing

  • Author Statement
    Stanley L. Hurst
  • Publication
    The Institution of Electrical Engineers
  • Publication Year
    1998
  • Collation
    xx, 532 p.: illus.; 24 cm
  • Series
    IEE circuits, devices and systems series; 9
  • Subject

    Integrated circuits -- Very large scale integration -- Testing

  • Holding Info.
    0852969015
  • Original By
    77/04
  • DocumentNumber
    43960
  • SubTitle
    : digital and mixed analogue/digital techniques
  • Biblography
    Includes bibliographical references and index
  • BL
    BL