RecordNumber :
31943
LC Class :
TK
LC Number :
7874
LC CutterNumber :
.H87
Author :
Hurst, Stanley L
Title :

VLSI testing

Author Statement :
Stanley L. Hurst
Publication :
The Institution of Electrical Engineers
Publication Year :
1998
Collation :
xx, 532 p.: illus.; 24 cm
Series :
IEE circuits, devices and systems series; 9
Subject :
Integrated circuits -- Very large scale integration -- Testing
Holding Info. :
0852969015
Original By :
77/04
DocumentNumber :
43960
SubTitle :
: digital and mixed analogue/digital techniques
Biblography :
Includes bibliographical references and index
BL :
BL
Link To Document :

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