Microelectronic failure analysis

RecordNumber :

32939

LC Class :

LC Number :

7871

LC CutterNumber :

.M52

LC Date :

1993

Title :

Author Statement :

Thomas W. Lee, editor, Seshu V. Pabbisetty, editor

Edition :

3rd ed

Publication :

ASM International

Publication Year :

c1993

Collation :

xv, 409 p.: illus.; 27 cm

Subject :

ADDED ENTRIES :

Lee, Thomas W

Holding Info. :

087170479

Original By :

77/10

DocumentNumber :

44940

SubTitle :

: desk reference

Index :

Includes index

BL :

Link To Document :