Title :
Beam effects, surface topography, and depth profiling in surface analysis
Author Statement :
edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell
Publication :
Plenum Press
Collation :
xix, 430 p.: ill.; 24 cm
Series :
Methods of surface characterization: v. 5
Subject :
Surface (Technology) -- Analysis,Materials -- Effect of radiation on
ADDED ENTRIES :
Czanderna, Alvin Warren
Holding Info. :
0306458969
Glossary :
Includes bibliographical references and index
