RecordNumber

35750

LC Class

TK

LC Number

7895

LC CutterNumber

.M4,I334

LC Date

1997

Dewey Class

621

Dewey Number

.39

Dewey Date

/732

Author

IEEE International Workshop on Memory Technology, Design, and Testing (1997 : San Jose, Calif.)

Title

Proceedings

Author Statement

edited by F. Lombardi, R. Rajsuman, and T. Wik

Publication

IEEE Computer Society Press

Publication Year

c1997

Collation

ix, 103 p.:ill.;28 cm

Notes

"August 11-12, 1997, San Jose, California"

Subject

Semiconductor storage devices- Testing- Congresse,Random access memory- Congresses

ADDED ENTRIES

Lombardi, Fabrizio,1955-

Holding Info.

0818680997

Original By

79/01

DocumentNumber

46873

SubTitle

: International Workshop on Memory Technology, Design, and Testing

Biblography

Includes bibliographical references and index

BL

BL