RecordNumber
:
40039
LC Class
:
TK
LC Number
:
7871.852
LC CutterNumber
:
.C47
Dewey Class
:
621
Dewey Number
:
.3815
Dewey Date
:
/2
Author
:
Chim, Wai Kin
Title
:
Semiconductor device and failue analysis
Author Statement
:
Wai Kin Chim
Publication
:
Wiley
Publication Year
:
2000
Collation
:
xv, 269 p.:ill.;24 cm
Subject
:
Semiconductors- Failures,Semiconductors- Testing,Semiconductors- Microscopy,Photon emission
Holding Info.
:
047149240
Original By
:
80/08
DocumentNumber
:
49973
SubTitle
:
: using photon emission microscopy
Biblography
:
Includes bibliographical references and index
BL
:
BL
Link To Document :
https://library.iut.ac.ir/dL/search/default.aspx?Term=40039&Field=0&DTC=100
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