• RecordNumber
    45078
  • LC Class
    TK
  • LC Number
    7895
  • LC CutterNumber
    .M4,I334
  • LC Date
    2004
  • Dewey Class
    621.39
  • Dewey Number
    732
  • Author

    IEEE International Workshop on Memory Technology, Design and Testing (12th :2004 :San Jose, Calif.)

  • Title

    MTDT 2004

  • Author Statement
    edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council ... and others
  • Publication
    IEEE Computer Society
  • Publication Year
    c2004
  • Collation
    vii, 121 p. ill. 27 cm.
  • Subject

    Semiconductor storage devices- Testing- Congresses,Random access memory- Congresses

  • ADDED ENTRIES
    Rajsuman, Rochit
  • DocumentNumber
    54864
  • SubTitle
    records of the 2004 International Workshop on ..., 9-10 August, 2004, San Jose, California, USA
  • Biblography
    Includes bibliographical references and author index
  • ISBN
    0769521932
  • BL
    BL
    • Link To Document
    https://library.iut.ac.ir/dl/search/default.aspx?Term=45078&Field=0&DTC=100