• RecordNumber
    50935
  • LC Class
    TK
  • LC Number
    7874.654
  • LC CutterNumber
    .T48
  • LC Date
    2008
  • Title

    Test and diagnosis of analogue, mixed-signal and RF integrated circuits

  • Author Statement
    edited by Yichuang Sun
  • Publication
    London Institution of Engineering and Technology
  • Publication Year
    2008
  • Collation
    xx, 389 p.: ill.
  • Series
    IET circuits, devices and systems series 19
  • Subject

    Linear integrated circuits -- Testing , Mixed signal circuits -- Testing , Radio frequency integrated circuits -- Testing

  • ADDED ENTRIES
    AU Sun, Yichuang
  • وارد كنندة اطلاعات
    aghaee
  • تاريخ ورود اطلاعات
    1392/06/10
  • SubTitle
    the system on chip approach
  • Index
    Includes bibliographical references and index