37

1997

923-927

Microelectron. Reliab

pdf

An attempt has been made in this paper to estimate the reliability of an s-out-of-k system with non-identical component strengths when component strengths follow an exponential distribution. A further assumption is made that all the components are subjected to a common random stress which also follow an exponential distribution. Bayes and maximum likelihood estimators of such system reliability are considered. A Bayes estimate is obtained by using Lindleyʹs approximation. Comparisons are made on the basis of efficiency and Pitman nearness probability through a Monte-Carlo study. © 1997 Elsevier Science Ltd. All rights reserved.

EA 10

1397/09/28

dashagha

11

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